HOME
MODEL 2010/ M OVERVIEW
Applications Overview
Optical Waveguide Characterization
Waveguide Loss Measurement
Bulk Material or Thick Film Index/Birefringence Measurement
Index vs Temperature Option (dn/dT)
Measuring Effect of Nanomaterials/Dopants and Process Variables on Index
Measuring Index of Liquids Inside Sealed Containers
Mesuring Index and Thickness of Silicon Films/Waveguides
Measuring Index of Contact and Intraocular Lenses While Submerged in Hydrating Fluid
Spectroscopic Measurements of Index vs Wavelength (Dispersion)
Characterization of SPR and Waveguide Structures for Sensor Applications
High Accuracy Measurement of Resist, Polyimide, and Polymer Thin Films
Measuring Index/Birefringence of Bulk Polymers and Flexible Polymer Films
Dual Film Measurements
Monitoring of Phosphorus and Other Dopant Concentrations in Silicon Dioxide
ELLIPSOMETRY COMPARISON
JOURNAL REFERENCES
SPECIFICATIONS
ORDERING GUIDE
Request for Information
Sales Reps

Metricon

HOME
MODEL 2010/ M OVERVIEW
Applications Overview
Optical Waveguide Characterization
Waveguide Loss Measurement
Bulk Material or Thick Film Index/Birefringence Measurement
Index vs Temperature Option (dn/dT)
Measuring Effect of Nanomaterials/Dopants and Process Variables on Index
Measuring Index of Liquids Inside Sealed Containers
Mesuring Index and Thickness of Silicon Films/Waveguides
Measuring Index of Contact and Intraocular Lenses While Submerged in Hydrating Fluid
Spectroscopic Measurements of Index vs Wavelength (Dispersion)
Characterization of SPR and Waveguide Structures for Sensor Applications
High Accuracy Measurement of Resist, Polyimide, and Polymer Thin Films
Measuring Index/Birefringence of Bulk Polymers and Flexible Polymer Films
Dual Film Measurements
Monitoring of Phosphorus and Other Dopant Concentrations in Silicon Dioxide
ELLIPSOMETRY COMPARISON
JOURNAL REFERENCES
SPECIFICATIONS
ORDERING GUIDE
Request for Information
Sales Reps

Sample Measurement Videos

1. Measuring Index and Thickness for a Single Film on a High Index (Silicon) Substrate

2. Measuring Index, Thickness and Loss for a Single Film on a Glass Substrate of Lower index

3. Measuring Refractive Index, Dispersion (Index vs Wavelength) and Abbe Numbers of a Bulk Glass Sample

4. Measuring Index, Thickness and Loss at 637 nm Wavelength for a Dual Film on a Silicon Substrate

5. Measuring Index, Thickness and Loss at ~1550 nm Wavelength for a Dual Film on a Silicon Substrate

6. Measuring index and Thickness of a Coating on a Flexible Polymer PET Substrate. Measuring Index Anisotropy of Polymer PET substrate.

7. Measuring Index and Thickness of a Thin (~50 Micron)  Flexible Polymer Material

8. Measuring Index, Dispersion (Index vs Wavelength) and Anisotropy of a Bulk (PET) Material

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