The Model 2010/M Prism Coupler utilizes advanced optical waveguiding techniques to rapidly and accurately measure both the thickness and the refractive index/birefringence of dielectric and polymer films. For many thin film and optical waveguide applications, the Model 2010/M offers unique advantages over conventional instruments based on ellipsometry or spectrophotometry:

• no advance knowledge of thickness or required
  
  
• routine resolution of ±.0005 – an order of magnitude better than other techniques, (higher resolution available)
  
  
• completely general – no fixed menus of film/substrate combinations
  
  
• measures thickness and for each film of dual film structures
  
  
• high accuracy measurement of bulk or substrate materials
  
  
• easy measurement of anisotropy/birefringence
  
  
• rapid (20-second) characterization of thin film or diffused optical waveguides