Metricon’s Model 2010/M offers unmatched ease and accuracy in measuring:
• Refractive index/birefringence of bulk materials
• Refractive index and thickness of thin films
• Loss of optical waveguides
Compared to instruments based on optical interference, ellipsometry, or Abbe refractometry, the 2010/M’s prism coupling technology provides unmatched index accuracy/resolution, and minimal sample preparation is required. The system also measures dispersion, index gradients, dn/dT, and loss of optical waveguides.
Since Metricon introduced its first prism coupling system in 1980, more than a thousand systems have been sold to top universities, research labs and companies in more than 40 countries.