| Model 2010/M | Prism coupler (includes one prism -- see below). Complete system, includes 633 nm HeNe laser, Dell OPTIPLEX PC, 17" LCD monitor, compact thermal printer, mouse, Windows XP Professional. |
| 2010-USC | Credit for user-supplied computer. Computer must provide Windows 98/NT/2000/XP and serial (COM1) port. |
| 200-P-1 | Prism for measuring low index films. Optimum prism for films with index <1.80 |
| 200-P-2 | Prism for measuring high index films (index range 1.80-2.45) |
| 200-P-3 | Prism for measuring films over broad (1.4-2.1) index range |
| 200-P-4 | Prism for measuring films over broad (1.4-2.0) index range. More durable than 200-P-3 above. |
| SPECIAL PRISMS | 10 additional prism types are available from stock for special measurement needs. |
| 2010-VO | Option to permit rapid (30-second) conversion to non-contact, thickness-only VAMFO measurements VAMFO measurements of films ranging from approximately 2 to 150 microns. |
| 2010-TM | Option to permit observation of TM modes or film birefringence (measures index perpendicular to sample surface). In some cases, allows measurement of thickness and index of films as thin as 100 nm.
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| 2010-TC | Measures index vs temperature up to 150º C. |
| 2010-WGL1 | Waveguide loss measurement option (moving fiber) for 450-1064 nm (see below for other wavelength options) |
| 2010-WGL2 | Waveguide loss measurement option (moving fiber) for 600-1600 nm (see below for other wavelength options) |
| For applications requiring index measurement at other wavelengths, the Model 2010/M can conveniently accommodate three lasers (or ports for external user-supplied lasers) in addition to the 633 nm HeNe which is always provided. With each of these additional sources, measurement wavelength is easily changed in less than thirty seconds. |
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| 2010-NSW-1550 | Addition of nominal 1550 nm diode laser (requires option 2010/M-GE) |
| 2010-NSW-1300 | Addition of nominal 1300 nm solid state laser (requires option 2010/M-GE) |
| 2010-NSW-1064 | Addition of 1064 nm laser. |
| 2010-NSW-980 | Addition of nominal 980 nm solid state laser |
| 2010-NSW-830 | Addition of nominal 830 nm solid state laser |
| 2010-NSW-532 | Addition of compact 532 nm frequency doubled YAG laser |
| 2010-NSW-405 | Addition of nominal 405 nm) solid state laser |
| 2010-NSW-XXXX | Additional wavelengths (440, 473, 543, 780, 850 and others) available on request |
| 2010-SBL-VIS | Secondary input port for 440-1060 nm user-supplied laser(s) |
| 2010-SBL-IR | Secondary input port for 633-1600 nm user-supplied laser(s) (requires option 2010/M-GE) |
| 2010-GE | Germanium detector option (required for operation above 1100 nm) |
Please consult Metricon or an authorized representative for current pricing and for detailed specs of current Metricon-supplied Dell PC's. |
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Copyright © 2006 Metricon Corp. All rights reserved.
Last revised:12/13/07
