Since its inception in 1980, Metricon^® Corporation has pioneered the practical application of prism coupling technology to problems of thin film, bulk material, and optical waveguide, and SPR characterization. Metricon introduced the world's first commercial prism coupling instrument, the PC-200, in 1980. Metricon's fourth-generation and current prism coupling system, the 2010/M, features a new Windows-based interface offering both XP^® and Vista^® compatibility, and Metricon continues to enhance system capabilities as user requirements evolve. Since its introduction in the early 1990's, more than 650 Model 2010 family systems have been delivered to top universities, research institutes, and corporations in 35 countries and Metricon prism coupling systems have been referenced in hundreds of articles in scientific journals.

 

The Model 2010/M Prism Coupler utilizes advanced optical waveguiding techniques to rapidly and accurately measure both the thickness and the refractive index/birefringence of dielectric and polymer films. For many thin film and optical waveguide applications, the Model 2010/M offers unique advantages over conventional instruments based on ellipsometry or spectrophotometry:
no advance knowledge of thickness or required
routine resolution of ±.0005 ­ an order of magnitude better than other techniques, (higher resolution available)
completely general ­ no fixed menus of film/substrate combinations
measures thickness and for each film of dual film structures
high accuracy measurement of bulk or substrate materials
easy measurement of anisotropy/birefringence
rapid (20-second) characterization of thin film or diffused optical waveguides

 

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Last revised: 8/28/08

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