MODEL 2010/M PRISM COUPLER
APPLICATION NOTES:
- MONITORING OF PHOSPHORUS AND
OTHER DOPANT CONCENTRATIONS
IN SILICON DIOXIDE
HIGH ACCURACY MEASUREMENT OF RESISTS, POLYIMIDES, AND POLYMERS
DUAL FILM MEASUREMENTS- OPTICAL WAVEGUIDE CHARACTERIZATION
BULK MATERIAL OR THICK FILM INDEX/BIREFRINGENCE MEASUREMENT
MEASURING INDEX ANISOTROPY/BIREFRINGENCE OF FREE-STANDING POLYMER FILMS
MEASURING INDEX VS TEMPERATURE
Home
Basic Description
Features & Specifications
Comparison to Ellipsometry
Journal References
Applications Overview
Application Notes
Ordering/Options Guide
Metricon Sales Reps
Copyright © 2006 Metricon Corp. All rights reserved.